A Failure Diagnosis Method for Multichip IGBT Modules Using a Novel Chip Failure Sensitive Parameter.
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| Title: | A Failure Diagnosis Method for Multichip IGBT Modules Using a Novel Chip Failure Sensitive Parameter. |
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| Authors: | Du, Mingxing1 (AUTHOR), Tang, Chudong1 (AUTHOR), Yang, Jianxiong1 (AUTHOR), Yin, Jinliang1 (AUTHOR) yinjinliang2007@email.tjut.edu.cn |
| Source: | International Journal of Circuit Theory & Applications. Mar2026, p1. 12p. 18 Illustrations. |
| Database: | Academic Search Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 192281670 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: A Failure Diagnosis Method for Multichip IGBT Modules Using a Novel Chip Failure Sensitive Parameter. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Du%2C+Mingxing%22">Du, Mingxing</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tang%2C+Chudong%22">Tang, Chudong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yang%2C+Jianxiong%22">Yang, Jianxiong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yin%2C+Jinliang%22">Yin, Jinliang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> yinjinliang2007@email.tjut.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Circuit+Theory+%26+Applications%22">International Journal of Circuit Theory & Applications</searchLink>. Mar2026, p1. 12p. 18 Illustrations. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192281670 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/cta.70391 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 1 Titles: – TitleFull: A Failure Diagnosis Method for Multichip IGBT Modules Using a Novel Chip Failure Sensitive Parameter. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Du, Mingxing – PersonEntity: Name: NameFull: Tang, Chudong – PersonEntity: Name: NameFull: Yang, Jianxiong – PersonEntity: Name: NameFull: Yin, Jinliang IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 03 Text: Mar2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 00989886 Titles: – TitleFull: International Journal of Circuit Theory & Applications Type: main |
| ResultId | 1 |