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A Failure Diagnosis Method for Multichip IGBT Modules Using a Novel Chip Failure Sensitive Parameter.

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Bibliographic Details
Title: A Failure Diagnosis Method for Multichip IGBT Modules Using a Novel Chip Failure Sensitive Parameter.
Authors: Du, Mingxing1 (AUTHOR), Tang, Chudong1 (AUTHOR), Yang, Jianxiong1 (AUTHOR), Yin, Jinliang1 (AUTHOR) yinjinliang2007@email.tjut.edu.cn
Source: International Journal of Circuit Theory & Applications. Mar2026, p1. 12p. 18 Illustrations.
Database: Academic Search Ultimate
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