APA (7th ed.) Citation

Samadov, S. F., Guliyeva, K. M., Sidorin, A. A., Trung, N. V. M., Aliyev, Y. I., Orlov, O. S., & Jabarov, S. H. (2026). Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy. Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), 51(2), 2137. https://doi.org/10.1007/s13369-025-10262-2

Chicago Style (17th ed.) Citation

Samadov, S. F., Kh. M. Guliyeva, A. A. Sidorin, N. V. M. Trung, Y. I. Aliyev, O. S. Orlov, and S. H. Jabarov. "Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy." Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ) 51, no. 2 (2026): 2137. https://doi.org/10.1007/s13369-025-10262-2.

MLA (9th ed.) Citation

Samadov, S. F., et al. "Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy." Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), vol. 51, no. 2, 2026, p. 2137, https://doi.org/10.1007/s13369-025-10262-2.