Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy.
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| Title: | Defect Characterization in Cu |
|---|---|
| Authors: | Samadov, S. F.1,2,3,4 (AUTHOR), Guliyeva, Kh. M.5 (AUTHOR), Sidorin, A. A.2 (AUTHOR), Trung, N. V. M.2,6 (AUTHOR), Aliyev, Y. I.7,8 (AUTHOR), Orlov, O. S.2 (AUTHOR), Jabarov, S. H.5 (AUTHOR) sakin@jinr.ru |
| Source: | Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ). Jan2026, Vol. 51 Issue 2, p2137-2147. 11p. |
| Database: | Academic Search Ultimate |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 192432632 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Defect Characterization in Cu<subscript>2</subscript>NiX (X = SSe, Te<subscript>2</subscript>, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Samadov%2C+S%2E+F%2E%22">Samadov, S. F.</searchLink><relatesTo>1,2,3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guliyeva%2C+Kh%2E+M%2E%22">Guliyeva, Kh. M.</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sidorin%2C+A%2E+A%2E%22">Sidorin, A. A.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Trung%2C+N%2E+V%2E+M%2E%22">Trung, N. V. M.</searchLink><relatesTo>2,6</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Aliyev%2C+Y%2E+I%2E%22">Aliyev, Y. I.</searchLink><relatesTo>7,8</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Orlov%2C+O%2E+S%2E%22">Orlov, O. S.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jabarov%2C+S%2E+H%2E%22">Jabarov, S. H.</searchLink><relatesTo>5</relatesTo> (AUTHOR)<i> sakin@jinr.ru</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Arabian+Journal+for+Science+%26+Engineering+%28Springer+Science+%26+Business+Media+B%2EV%2E+%29%22">Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. )</searchLink>. Jan2026, Vol. 51 Issue 2, p2137-2147. 11p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192432632 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s13369-025-10262-2 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 2137 Titles: – TitleFull: Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Samadov, S. F. – PersonEntity: Name: NameFull: Guliyeva, Kh. M. – PersonEntity: Name: NameFull: Sidorin, A. A. – PersonEntity: Name: NameFull: Trung, N. V. M. – PersonEntity: Name: NameFull: Aliyev, Y. I. – PersonEntity: Name: NameFull: Orlov, O. S. – PersonEntity: Name: NameFull: Jabarov, S. H. IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 01 Text: Jan2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 2193567X Numbering: – Type: volume Value: 51 – Type: issue Value: 2 Titles: – TitleFull: Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ) Type: main |
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