Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy.
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| Title: | Defect Characterization in Cu |
|---|---|
| Authors: | Samadov, S. F.1,2,3,4 (AUTHOR), Guliyeva, Kh. M.5 (AUTHOR), Sidorin, A. A.2 (AUTHOR), Trung, N. V. M.2,6 (AUTHOR), Aliyev, Y. I.7,8 (AUTHOR), Orlov, O. S.2 (AUTHOR), Jabarov, S. H.5 (AUTHOR) sakin@jinr.ru |
| Source: | Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ). Jan2026, Vol. 51 Issue 2, p2137-2147. 11p. |
| Database: | Academic Search Ultimate |
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