Ansari, Z. A., Soni, S., Fatima, S., Siddiqui, S., & Prasad, P. V. H. (2025). A multi-model deep learning framework for SEM-based defect detection in Perovskite thin films. Scientific Reports, 15(1), 1. https://doi.org/10.1038/s41598-025-25848-x
Chicago Style (17th ed.) CitationAnsari, Zulfikar Ali, Sahil Soni, Shahin Fatima, Shadab Siddiqui, and P. Venkata Hari Prasad. "A Multi-model Deep Learning Framework for SEM-based Defect Detection in Perovskite Thin Films." Scientific Reports 15, no. 1 (2025): 1. https://doi.org/10.1038/s41598-025-25848-x.
MLA (9th ed.) CitationAnsari, Zulfikar Ali, et al. "A Multi-model Deep Learning Framework for SEM-based Defect Detection in Perovskite Thin Films." Scientific Reports, vol. 15, no. 1, 2025, p. 1, https://doi.org/10.1038/s41598-025-25848-x.