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A multi-model deep learning framework for SEM-based defect detection in Perovskite thin films.

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Title: A multi-model deep learning framework for SEM-based defect detection in Perovskite thin films.
Authors: Ansari, Zulfikar Ali1 (AUTHOR) zulfikar.ansari@sitpune.edu.in, Soni, Sahil1 (AUTHOR), Fatima, Shahin2 (AUTHOR), Siddiqui, Shadab2 (AUTHOR), Prasad, P. Venkata Hari3 (AUTHOR)
Source: Scientific Reports. 11/25/2025, Vol. 15 Issue 1, p1-16. 16p.
Database: Academic Search Ultimate
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  Data: A multi-model deep learning framework for SEM-based defect detection in Perovskite thin films.
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  Data: <searchLink fieldCode="JN" term="%22Scientific+Reports%22">Scientific Reports</searchLink>. 11/25/2025, Vol. 15 Issue 1, p1-16. 16p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192686144
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        Value: 10.1038/s41598-025-25848-x
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