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An electric characterization method for identifying the number and position of unintended defect dots formed in silicon quantum dot devices.

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Title: An electric characterization method for identifying the number and position of unintended defect dots formed in silicon quantum dot devices.
Authors: Chiashi, Yusuke1 (AUTHOR) yusuke.chiashi@aist.go.jp, Kato, Kimihiko1 (AUTHOR), Iba, Yoshihisa1 (AUTHOR), Oka, Hiroshi1 (AUTHOR), Iizuka, Shota1 (AUTHOR), Asai, Hidehiro1 (AUTHOR), Ogura, Minoru1 (AUTHOR), Inaba, Takumi1 (AUTHOR), Mori, Takahiro1 (AUTHOR) yusuke.chiashi@aist.go.jp
Source: APL Electronic Devices. Mar2026, Vol. 2 Issue 1, p1-6. 6p.
Database: Academic Search Ultimate
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An: 192689820
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  Data: An electric characterization method for identifying the number and position of unintended defect dots formed in silicon quantum dot devices.
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  Data: <searchLink fieldCode="AR" term="%22Chiashi%2C+Yusuke%22">Chiashi, Yusuke</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> yusuke.chiashi@aist.go.jp</i><br /><searchLink fieldCode="AR" term="%22Kato%2C+Kimihiko%22">Kato, Kimihiko</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Iba%2C+Yoshihisa%22">Iba, Yoshihisa</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Oka%2C+Hiroshi%22">Oka, Hiroshi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Iizuka%2C+Shota%22">Iizuka, Shota</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Asai%2C+Hidehiro%22">Asai, Hidehiro</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ogura%2C+Minoru%22">Ogura, Minoru</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Inaba%2C+Takumi%22">Inaba, Takumi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Mori%2C+Takahiro%22">Mori, Takahiro</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> yusuke.chiashi@aist.go.jp</i>
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  Data: <searchLink fieldCode="JN" term="%22APL+Electronic+Devices%22">APL Electronic Devices</searchLink>. Mar2026, Vol. 2 Issue 1, p1-6. 6p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192689820
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        Value: 10.1063/5.0312498
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        Text: English
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              Text: Mar2026
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