APA (7th ed.) Citation

SHARMA, P., PARVIN, S., AMANDEEP, P., TIWARI, P., SHARMA, S., & YADAV, K. (2026). AN OPTIMIZATION-BASED RELIABILITY FRAMEWORK FOR DIGITAL CONSUMERISM, YOUTH ASPIRATIONAL BUYING, AND EMI CULTURE: TRAPPED IN THE CART. Reliability: Theory & Applications, 21(1), 286. https://doi.org/10.24412/1932-2321-2026-190-286-297

Chicago Style (17th ed.) Citation

SHARMA, PULKIT, SAMINA PARVIN, PANDIT AMANDEEP, PRIYANKA TIWARI, SURUCHI SHARMA, and KIRAN YADAV. "AN OPTIMIZATION-BASED RELIABILITY FRAMEWORK FOR DIGITAL CONSUMERISM, YOUTH ASPIRATIONAL BUYING, AND EMI CULTURE: TRAPPED IN THE CART." Reliability: Theory & Applications 21, no. 1 (2026): 286. https://doi.org/10.24412/1932-2321-2026-190-286-297.

MLA (9th ed.) Citation

SHARMA, PULKIT, et al. "AN OPTIMIZATION-BASED RELIABILITY FRAMEWORK FOR DIGITAL CONSUMERISM, YOUTH ASPIRATIONAL BUYING, AND EMI CULTURE: TRAPPED IN THE CART." Reliability: Theory & Applications, vol. 21, no. 1, 2026, p. 286, https://doi.org/10.24412/1932-2321-2026-190-286-297.