Hao, L., Li, J., Peng, C., Dai, C., Li, Z., Li, X., . . . Zhao, Q. (2026). A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications. International Journal of Circuit Theory & Applications, 1. https://doi.org/10.1002/cta.70443
Chicago Style (17th ed.) CitationHao, Licai, et al. "A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications." International Journal of Circuit Theory & Applications 2026: 1. https://doi.org/10.1002/cta.70443.
MLA (9th ed.) CitationHao, Licai, et al. "A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications." International Journal of Circuit Theory & Applications, 2026, p. 1, https://doi.org/10.1002/cta.70443.
Warning: These citations may not always be 100% accurate.
