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A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications.

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Title: A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications.
Authors: Hao, Licai1,2 (AUTHOR), Li, Jiaqing1,2 (AUTHOR), Peng, Chunyu1,2 (AUTHOR), Dai, Chenghu1,2 (AUTHOR), Li, Zhigang1,2 (AUTHOR), Li, Xin1,2 (AUTHOR), Lin, Zhiting1,2 (AUTHOR), Wu, Xiulong1,2 (AUTHOR), Zhu, Ming1,2 (AUTHOR) zhaoqiang@ahu.edu.cn, Zhao, Qiang1,2 (AUTHOR) zhaoqiang@ahu.edu.cn
Source: International Journal of Circuit Theory & Applications. Apr2026, p1. 13p. 12 Illustrations.
Database: Academic Search Ultimate
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DbLabel: Academic Search Ultimate
An: 193037777
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications.
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Circuit+Theory+%26+Applications%22">International Journal of Circuit Theory & Applications</searchLink>. Apr2026, p1. 13p. 12 Illustrations.
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        Value: 10.1002/cta.70443
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        Text: English
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              M: 04
              Text: Apr2026
              Type: published
              Y: 2026
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