A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications.
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| Title: | A Triple‐Node‐Upset Self‐Recovery Latch Features Low Soft Error Rate for Aerospace Applications. |
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| Authors: | Hao, Licai1,2 (AUTHOR), Li, Jiaqing1,2 (AUTHOR), Peng, Chunyu1,2 (AUTHOR), Dai, Chenghu1,2 (AUTHOR), Li, Zhigang1,2 (AUTHOR), Li, Xin1,2 (AUTHOR), Lin, Zhiting1,2 (AUTHOR), Wu, Xiulong1,2 (AUTHOR), Zhu, Ming1,2 (AUTHOR) zhaoqiang@ahu.edu.cn, Zhao, Qiang1,2 (AUTHOR) zhaoqiang@ahu.edu.cn |
| Source: | International Journal of Circuit Theory & Applications. Apr2026, p1. 13p. 12 Illustrations. |
| Database: | Academic Search Ultimate |
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