Wang, C., Ho, C., Chen, Y., & Chen, Y. (2026). AN EXPERT SYSTEM WITH LAYERED EVOLUTION-BASED FEATURE EXTRACTION FOR EPIDEMIC MONITORING. International Journal of Industrial Engineering, 33(2), 273. https://doi.org/10.23055/ijietap.2026.33.2.11331
Chicago Style (17th ed.) CitationWang, Cheng-Yi, Chien-Ta Ho, Yi-Siang Chen, and Yan-Kwang Chen. "AN EXPERT SYSTEM WITH LAYERED EVOLUTION-BASED FEATURE EXTRACTION FOR EPIDEMIC MONITORING." International Journal of Industrial Engineering 33, no. 2 (2026): 273. https://doi.org/10.23055/ijietap.2026.33.2.11331.
MLA (9th ed.) CitationWang, Cheng-Yi, et al. "AN EXPERT SYSTEM WITH LAYERED EVOLUTION-BASED FEATURE EXTRACTION FOR EPIDEMIC MONITORING." International Journal of Industrial Engineering, vol. 33, no. 2, 2026, p. 273, https://doi.org/10.23055/ijietap.2026.33.2.11331.