APA (7th ed.) Citation

Vo, V., Lim, H., Dang, T. H. T., Lee, N., Lee, J., Kim, D., . . . Heo, Y. (2026). Multi‐Functional Interface‐Driven Defect Passivation Enabling High Efficiency and Stability in Vacuum‐Processed Perovskite Light‐Emitting Diodes. Advanced Optical Materials, 14(15), 1. https://doi.org/10.1002/adom.202503707

Chicago Style (17th ed.) Citation

Vo, Van‐Khoe, et al. "Multi‐Functional Interface‐Driven Defect Passivation Enabling High Efficiency and Stability in Vacuum‐Processed Perovskite Light‐Emitting Diodes." Advanced Optical Materials 14, no. 15 (2026): 1. https://doi.org/10.1002/adom.202503707.

MLA (9th ed.) Citation

Vo, Van‐Khoe, et al. "Multi‐Functional Interface‐Driven Defect Passivation Enabling High Efficiency and Stability in Vacuum‐Processed Perovskite Light‐Emitting Diodes." Advanced Optical Materials, vol. 14, no. 15, 2026, p. 1, https://doi.org/10.1002/adom.202503707.