Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications. - Del-Valle-Soto, Carolina; Del-Puerto-Flores, José A.; Velázquez, Ramiro; Botero-Valencia, Juan Sebastián; Valdivia, Leonardo J.; Varela-Aldás, José; Visconti, Paolo (Symmetry (20738994), 2026)