Wich, M., Helmerich, J., Ott, P., Ambacher, O., & Rupitsch, S. J. (2026). Effect of Heating/Cooling Rate and Temperature on Microstructure and Electrical Properties of Sputter-Deposited PZT Thin Films Crystallized by Conventional Furnace Annealing. Materials (1996-1944), 19(9), 1782. https://doi.org/10.3390/ma19091782
Chicago Style (17th ed.) CitationWich, Manfred, Jan Helmerich, Philipp Ott, Oliver Ambacher, and Stefan Johann Rupitsch. "Effect of Heating/Cooling Rate and Temperature on Microstructure and Electrical Properties of Sputter-Deposited PZT Thin Films Crystallized by Conventional Furnace Annealing." Materials (1996-1944) 19, no. 9 (2026): 1782. https://doi.org/10.3390/ma19091782.
MLA (9th ed.) CitationWich, Manfred, et al. "Effect of Heating/Cooling Rate and Temperature on Microstructure and Electrical Properties of Sputter-Deposited PZT Thin Films Crystallized by Conventional Furnace Annealing." Materials (1996-1944), vol. 19, no. 9, 2026, p. 1782, https://doi.org/10.3390/ma19091782.