APA (7th ed.) Citation

Liu, G., Cai, Y., Huang, W., Guo, R., Li, Y., Tang, Y., . . . Wang, J. (2026). Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles. Spectrochimica Acta Part B, 241, N.PAG. https://doi.org/10.1016/j.sab.2026.107525

Chicago Style (17th ed.) Citation

Liu, Gong-Wen, Yu-Xin Cai, Wei-Nan Huang, Rong-Rong Guo, Yu Li, Yu Tang, Song-You Lian, and Jiang-Yong Wang. "Peak Shift in Depth Profiling: Unraveling the Influence of Film Thickness and Sputtered Crater in Glow Discharge Spectrometry Depth Profiles." Spectrochimica Acta Part B 241 (2026): N.PAG. https://doi.org/10.1016/j.sab.2026.107525.

MLA (9th ed.) Citation

Liu, Gong-Wen, et al. "Peak Shift in Depth Profiling: Unraveling the Influence of Film Thickness and Sputtered Crater in Glow Discharge Spectrometry Depth Profiles." Spectrochimica Acta Part B, vol. 241, 2026, p. N.PAG, https://doi.org/10.1016/j.sab.2026.107525.