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Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles.

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Title: Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles.
Authors: Liu, Gong-Wen1 (AUTHOR), Cai, Yu-Xin1 (AUTHOR), Huang, Wei-Nan1 (AUTHOR), Guo, Rong-Rong2 (AUTHOR), Li, Yu3 (AUTHOR), Tang, Yu4 (AUTHOR), Lian, Song-You1 (AUTHOR) sylian1@stu.edu.cn, Wang, Jiang-Yong1,5 (AUTHOR) 15017214200@163.com
Source: Spectrochimica Acta Part B. Jul2026, Vol. 241, pN.PAG-N.PAG. 1p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 193722499
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles.
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  Data: <searchLink fieldCode="AR" term="%22Liu%2C+Gong-Wen%22">Liu, Gong-Wen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Cai%2C+Yu-Xin%22">Cai, Yu-Xin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Huang%2C+Wei-Nan%22">Huang, Wei-Nan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guo%2C+Rong-Rong%22">Guo, Rong-Rong</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Li%2C+Yu%22">Li, Yu</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tang%2C+Yu%22">Tang, Yu</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lian%2C+Song-You%22">Lian, Song-You</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> sylian1@stu.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Wang%2C+Jiang-Yong%22">Wang, Jiang-Yong</searchLink><relatesTo>1,5</relatesTo> (AUTHOR)<i> 15017214200@163.com</i>
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  Data: <searchLink fieldCode="JN" term="%22Spectrochimica+Acta+Part+B%22">Spectrochimica Acta Part B</searchLink>. Jul2026, Vol. 241, pN.PAG-N.PAG. 1p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193722499
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1016/j.sab.2026.107525
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 1
        StartPage: N.PAG
    Titles:
      – TitleFull: Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Liu, Gong-Wen
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            NameFull: Cai, Yu-Xin
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          Name:
            NameFull: Huang, Wei-Nan
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            NameFull: Guo, Rong-Rong
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            NameFull: Li, Yu
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            NameFull: Tang, Yu
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            NameFull: Lian, Song-You
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            NameFull: Wang, Jiang-Yong
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          Dates:
            – D: 01
              M: 07
              Text: Jul2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 05848547
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            – Type: volume
              Value: 241
          Titles:
            – TitleFull: Spectrochimica Acta Part B
              Type: main
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