Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles. - Liu, Gong-Wen; Cai, Yu-Xin; Huang, Wei-Nan; Guo, Rong-Rong; Li, Yu; Tang, Yu; Lian, Song-You; Wang, Jiang-Yong (Spectrochimica Acta Part B, 2026)