INSPECTION AND METROLOGY CHALLENGES IN HYBRID BONDING.
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| Title: | INSPECTION AND METROLOGY CHALLENGES IN HYBRID BONDING. |
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| Authors: | Kottur, Himanandhan Reddy1 h.kottur@ufl.edu, Arjunamahanthi, Pavanbabu1, Biswas, Liton Kumar1, Shiam, Istiaq Firoz1, Yahyaei, Katayoon1, Asadizanjani, Navid1 |
| Source: | Electronic Device Failure Analysis. May2026, Vol. 28 Issue 2, p12-24. 11p. |
| Database: | Academic Search Ultimate |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 193736293 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193736293 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 12 Titles: – TitleFull: INSPECTION AND METROLOGY CHALLENGES IN HYBRID BONDING. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kottur, Himanandhan Reddy – PersonEntity: Name: NameFull: Arjunamahanthi, Pavanbabu – PersonEntity: Name: NameFull: Biswas, Liton Kumar – PersonEntity: Name: NameFull: Shiam, Istiaq Firoz – PersonEntity: Name: NameFull: Yahyaei, Katayoon – PersonEntity: Name: NameFull: Asadizanjani, Navid IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 15370755 Numbering: – Type: volume Value: 28 – Type: issue Value: 2 Titles: – TitleFull: Electronic Device Failure Analysis Type: main |
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