Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials#.
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| Title: | Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials#. |
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| Authors: | Lin, Yan‐Ru1 (AUTHOR) liny@ornl.gov, Zhong, Weicheng1 (AUTHOR), Calzada, Sabrina E.1 (AUTHOR), Lach, Timothy G.1 (AUTHOR), Nuckols, Lauren J.2 (AUTHOR), Parish, Chad M.1 (AUTHOR), Zinkle, Steven J.1,3 (AUTHOR), Burke, M. Grace1,4 (AUTHOR) |
| Source: | Journal of Microscopy. May2026, p1. 17p. 9 Illustrations. |
| Database: | Academic Search Ultimate |
| ISSN: | 00222720 |
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| DOI: | 10.1111/jmi.70122 |
