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Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials#.

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Title: Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials#.
Authors: Lin, Yan‐Ru1 (AUTHOR) liny@ornl.gov, Zhong, Weicheng1 (AUTHOR), Calzada, Sabrina E.1 (AUTHOR), Lach, Timothy G.1 (AUTHOR), Nuckols, Lauren J.2 (AUTHOR), Parish, Chad M.1 (AUTHOR), Zinkle, Steven J.1,3 (AUTHOR), Burke, M. Grace1,4 (AUTHOR)
Source: Journal of Microscopy. May2026, p1. 17p. 9 Illustrations.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 193921232
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials#.
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  Data: <searchLink fieldCode="AR" term="%22Lin%2C+Yan‐Ru%22">Lin, Yan‐Ru</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> liny@ornl.gov</i><br /><searchLink fieldCode="AR" term="%22Zhong%2C+Weicheng%22">Zhong, Weicheng</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Calzada%2C+Sabrina+E%2E%22">Calzada, Sabrina E.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lach%2C+Timothy+G%2E%22">Lach, Timothy G.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nuckols%2C+Lauren+J%2E%22">Nuckols, Lauren J.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Parish%2C+Chad+M%2E%22">Parish, Chad M.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zinkle%2C+Steven+J%2E%22">Zinkle, Steven J.</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Burke%2C+M%2E+Grace%22">Burke, M. Grace</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Microscopy%22">Journal of Microscopy</searchLink>. May2026, p1. 17p. 9 Illustrations.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193921232
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1111/jmi.70122
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 17
        StartPage: 1
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      – TitleFull: Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials#.
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            NameFull: Lin, Yan‐Ru
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            NameFull: Zhong, Weicheng
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            NameFull: Calzada, Sabrina E.
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            NameFull: Lach, Timothy G.
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            NameFull: Nuckols, Lauren J.
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            NameFull: Parish, Chad M.
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            NameFull: Zinkle, Steven J.
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            – D: 23
              M: 05
              Text: May2026
              Type: published
              Y: 2026
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            – TitleFull: Journal of Microscopy
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