APA (7th ed.) Citation

Dai, R., Lin, H., Liu, S., Liang, F., Lin, L., Sun, W., & Shen, J. (2026). High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns. Small Structures, 7(2), 1. https://doi.org/10.1002/sstr.202500687

Chicago Style (17th ed.) Citation

Dai, Ruoyu, HuiLi Lin, Songnan Liu, Fan Liang, Li Lin, Wei Sun, and Jie Shen. "High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns." Small Structures 7, no. 2 (2026): 1. https://doi.org/10.1002/sstr.202500687.

MLA (9th ed.) Citation

Dai, Ruoyu, et al. "High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns." Small Structures, vol. 7, no. 2, 2026, p. 1, https://doi.org/10.1002/sstr.202500687.