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High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns.

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Title: High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns.
Authors: Dai, Ruoyu1 (AUTHOR), Lin, HuiLi1 (AUTHOR), Liu, Songnan2,3 (AUTHOR), Liang, Fan1,4 (AUTHOR), Lin, Li1 (AUTHOR), Sun, Wei5 (AUTHOR), Shen, Jie1 (AUTHOR) shenjie@pku.edu.cn
Source: Small Structures. Feb2026, Vol. 7 Issue 2, p1-10. 10p.
Database: Academic Search Ultimate
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An: 194236509
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  Data: High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns.
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  Data: <searchLink fieldCode="JN" term="%22Small+Structures%22">Small Structures</searchLink>. Feb2026, Vol. 7 Issue 2, p1-10. 10p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194236509
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1002/sstr.202500687
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      – Code: eng
        Text: English
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        PageCount: 10
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      – TitleFull: High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns.
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            NameFull: Dai, Ruoyu
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            NameFull: Lin, HuiLi
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            NameFull: Liu, Songnan
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            NameFull: Lin, Li
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            NameFull: Sun, Wei
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            NameFull: Shen, Jie
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            – D: 01
              M: 02
              Text: Feb2026
              Type: published
              Y: 2026
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