High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns.
Saved in:
| Title: | High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns. |
|---|---|
| Authors: | Dai, Ruoyu1 (AUTHOR), Lin, HuiLi1 (AUTHOR), Liu, Songnan2,3 (AUTHOR), Liang, Fan1,4 (AUTHOR), Lin, Li1 (AUTHOR), Sun, Wei5 (AUTHOR), Shen, Jie1 (AUTHOR) shenjie@pku.edu.cn |
| Source: | Small Structures. Feb2026, Vol. 7 Issue 2, p1-10. 10p. |
| Database: | Academic Search Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!
