Cai, S., Wei, M., Huang, Z., Shuai, W., & Yu, F. (2026). A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications. Journal of Electronic Testing, 1. https://doi.org/10.1007/s10836-026-06239-0
Chicago Style (17th ed.) CitationCai, Shuo, Maoxuan Wei, Zhu Huang, Wei Shuai, and Fei Yu. "A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace Applications." Journal of Electronic Testing 2026: 1. https://doi.org/10.1007/s10836-026-06239-0.
MLA (9th ed.) CitationCai, Shuo, et al. "A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace Applications." Journal of Electronic Testing, 2026, p. 1, https://doi.org/10.1007/s10836-026-06239-0.