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A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications.

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Title: A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications.
Authors: Cai, Shuo1 (AUTHOR) caishuo@csust.edu.cn, Wei, Maoxuan2 (AUTHOR) 2425204594@qq.com, Huang, Zhu1 (AUTHOR) 2226811413@qq.com, Shuai, Wei1 (AUTHOR) 4208041782@csust.edu.cn, Yu, Fei1 (AUTHOR) yufeiyfyf@csust.edu.cn
Source: Journal of Electronic Testing. Jun2026, p1-14. 14p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 194276616
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications.
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  Data: <searchLink fieldCode="AR" term="%22Cai%2C+Shuo%22">Cai, Shuo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> caishuo@csust.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Wei%2C+Maoxuan%22">Wei, Maoxuan</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> 2425204594@qq.com</i><br /><searchLink fieldCode="AR" term="%22Huang%2C+Zhu%22">Huang, Zhu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> 2226811413@qq.com</i><br /><searchLink fieldCode="AR" term="%22Shuai%2C+Wei%22">Shuai, Wei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> 4208041782@csust.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Yu%2C+Fei%22">Yu, Fei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> yufeiyfyf@csust.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Testing%22">Journal of Electronic Testing</searchLink>. Jun2026, p1-14. 14p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194276616
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      – Type: doi
        Value: 10.1007/s10836-026-06239-0
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 14
        StartPage: 1
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      – TitleFull: A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications.
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          Name:
            NameFull: Cai, Shuo
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            NameFull: Wei, Maoxuan
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            NameFull: Huang, Zhu
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            NameFull: Shuai, Wei
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            NameFull: Yu, Fei
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          Dates:
            – D: 04
              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 09238174
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            – TitleFull: Journal of Electronic Testing
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