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Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography.

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Bibliographic Details
Title:	Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography.
Authors:	Zambito, Giorgio¹ (AUTHOR), Ferrando, Giulio¹ (AUTHOR), Barelli, Matteo¹ (AUTHOR), Ceccardi, Michele^1,2 (AUTHOR), Caglieris, Federico² (AUTHOR), Marrè, Daniele¹ (AUTHOR), Bisio, Francesco² (AUTHOR), Buatier de Mongeot, Francesco¹ (AUTHOR) francesco.buatier@unige.it, Giordano, Maria Caterina¹ (AUTHOR)
Source:	Small Science. Feb2026, Vol. 6 Issue 2, p1-10. 10p.
Database:	Academic Search Ultimate
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DOI:	10.1002/smsc.202500404