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Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography.

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Title: Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography.
Authors: Zambito, Giorgio1 (AUTHOR), Ferrando, Giulio1 (AUTHOR), Barelli, Matteo1 (AUTHOR), Ceccardi, Michele1,2 (AUTHOR), Caglieris, Federico2 (AUTHOR), Marrè, Daniele1 (AUTHOR), Bisio, Francesco2 (AUTHOR), Buatier de Mongeot, Francesco1 (AUTHOR) francesco.buatier@unige.it, Giordano, Maria Caterina1 (AUTHOR)
Source: Small Science. Feb2026, Vol. 6 Issue 2, p1-10. 10p.
Database: Academic Search Ultimate
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  Data: Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography.
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  Data: <searchLink fieldCode="JN" term="%22Small+Science%22">Small Science</searchLink>. Feb2026, Vol. 6 Issue 2, p1-10. 10p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194549237
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        Value: 10.1002/smsc.202500404
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        Text: English
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      – TitleFull: Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography.
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              Text: Feb2026
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              Y: 2026
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