APA (7th ed.) Citation

Ress, S., Farkas, G., Sarkany, Z., & Rencz, M. (2026). Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †. Energies (19961073), 19(11), 2678. https://doi.org/10.3390/en19112678

Chicago Style (17th ed.) Citation

Ress, Sandor, Gabor Farkas, Zoltan Sarkany, and Marta Rencz. "Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †." Energies (19961073) 19, no. 11 (2026): 2678. https://doi.org/10.3390/en19112678.

MLA (9th ed.) Citation

Ress, Sandor, et al. "Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †." Energies (19961073), vol. 19, no. 11, 2026, p. 2678, https://doi.org/10.3390/en19112678.