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Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †.

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Title: Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †.
Authors: Ress, Sandor1,2 (AUTHOR), Farkas, Gabor2 (AUTHOR), Sarkany, Zoltan1,2 (AUTHOR), Rencz, Marta1,2 (AUTHOR) rencz.marta@vik.bme.hu
Source: Energies (19961073). Jun2026, Vol. 19 Issue 11, p2678. 21p.
Database: Academic Search Ultimate
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  Data: Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †.
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  Data: <searchLink fieldCode="JN" term="%22Energies+%2819961073%29%22">Energies (19961073)</searchLink>. Jun2026, Vol. 19 Issue 11, p2678. 21p.
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        Value: 10.3390/en19112678
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        Text: English
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              Text: Jun2026
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              Y: 2026
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