Zhang, C., Yu, M., Dong, W., Zhan, J., Yu, S., Ma, J., & Xie, M. (2026). Active Verification for Missing-Annotation-Aware Tiny Surface Defect Detection in Resistors. Sensors (14248220), 26(12), 3912. https://doi.org/10.3390/s26123912
Chicago Style (17th ed.) CitationZhang, Chengdi, Mingxuan Yu, Wenzhang Dong, Jiaxuan Zhan, Shengdong Yu, Jinyu Ma, and Mingyang Xie. "Active Verification for Missing-Annotation-Aware Tiny Surface Defect Detection in Resistors." Sensors (14248220) 26, no. 12 (2026): 3912. https://doi.org/10.3390/s26123912.
MLA (9th ed.) CitationZhang, Chengdi, et al. "Active Verification for Missing-Annotation-Aware Tiny Surface Defect Detection in Resistors." Sensors (14248220), vol. 26, no. 12, 2026, p. 3912, https://doi.org/10.3390/s26123912.