An, Z., Yang, X., Liu, X., & Wu, H. (2026). Optimal Subgrade Lift Thickness Considering Continuous Compaction Control Technology. Symmetry (20738994), 18(6), 894. https://doi.org/10.3390/sym18060894
Chicago Style (17th ed.) CitationAn, Zaizhan, Xueqian Yang, Xiangyang Liu, and Haiyan Wu. "Optimal Subgrade Lift Thickness Considering Continuous Compaction Control Technology." Symmetry (20738994) 18, no. 6 (2026): 894. https://doi.org/10.3390/sym18060894.
MLA (9th ed.) CitationAn, Zaizhan, et al. "Optimal Subgrade Lift Thickness Considering Continuous Compaction Control Technology." Symmetry (20738994), vol. 18, no. 6, 2026, p. 894, https://doi.org/10.3390/sym18060894.
Warning: These citations may not always be 100% accurate.