APA (7th ed.) Citation

Chen, C., Gao, L., Jia, J., & Ding, Z. (2026). Focused-Ion-Beam Artifacts and Evidence Reliability in Advanced Microscopy of Energy Materials. Molecules, 31(12), 2148. https://doi.org/10.3390/molecules31122148

Chicago Style (17th ed.) Citation

Chen, Chen, Liangjuan Gao, Jiaqi Jia, and Zhao Ding. "Focused-Ion-Beam Artifacts and Evidence Reliability in Advanced Microscopy of Energy Materials." Molecules 31, no. 12 (2026): 2148. https://doi.org/10.3390/molecules31122148.

MLA (9th ed.) Citation

Chen, Chen, et al. "Focused-Ion-Beam Artifacts and Evidence Reliability in Advanced Microscopy of Energy Materials." Molecules, vol. 31, no. 12, 2026, p. 2148, https://doi.org/10.3390/molecules31122148.