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Focused-Ion-Beam Artifacts and Evidence Reliability in Advanced Microscopy of Energy Materials.

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Bibliographic Details
Title: Focused-Ion-Beam Artifacts and Evidence Reliability in Advanced Microscopy of Energy Materials.
Authors: Chen, Chen1 (AUTHOR), Gao, Liangjuan2 (AUTHOR), Jia, Jiaqi3 (AUTHOR), Ding, Zhao1,3 (AUTHOR) zhaoding@cqu.edu.cn
Source: Molecules. Jun2026, Vol. 31 Issue 12, p2148. 18p.
Database: Academic Search Ultimate
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An: 194938134
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  Data: Focused-Ion-Beam Artifacts and Evidence Reliability in Advanced Microscopy of Energy Materials.
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  Data: <searchLink fieldCode="AR" term="%22Chen%2C+Chen%22">Chen, Chen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gao%2C+Liangjuan%22">Gao, Liangjuan</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jia%2C+Jiaqi%22">Jia, Jiaqi</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ding%2C+Zhao%22">Ding, Zhao</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<i> zhaoding@cqu.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Molecules%22">Molecules</searchLink>. Jun2026, Vol. 31 Issue 12, p2148. 18p.
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        Value: 10.3390/molecules31122148
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      – Code: eng
        Text: English
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            NameFull: Chen, Chen
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            NameFull: Gao, Liangjuan
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            NameFull: Jia, Jiaqi
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              Text: Jun2026
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              Y: 2026
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