Li, D., Xu, Z., Chen, Z., Xu, S., Cui, J., Wo, S., . . . Ren, T. (2026). Pressure‐Induced Drift Artifacts in Stretchable Liquid Metal ThinFilm Electrocardiogram Electrodes. Advanced Science, 1. https://doi.org/10.1002/advs.76002
Chicago Style (17th ed.) CitationLi, Ding, et al. "Pressure‐Induced Drift Artifacts in Stretchable Liquid Metal ThinFilm Electrocardiogram Electrodes." Advanced Science 2026: 1. https://doi.org/10.1002/advs.76002.
MLA (9th ed.) CitationLi, Ding, et al. "Pressure‐Induced Drift Artifacts in Stretchable Liquid Metal ThinFilm Electrocardiogram Electrodes." Advanced Science, 2026, p. 1, https://doi.org/10.1002/advs.76002.
Warning: These citations may not always be 100% accurate.