Atomic‐Plane Distance as a Structural Indicator for Carrier‐Phonon Decoupling and Band Convergence in Doped BiCuSeO. - Yu, Penglu; Li, Mingxuan; Kainat, Javeria; Zhou, Zhifang; Wei, Bin; Lan, Jin‐Le; Yu, Yunhua; Jia, Xiaolong; Yang, Xiaoping; Lin, Yuan‐Hua (Advanced Functional Materials, 2026)