Wang, G., Mao, S., Tang, F., Hu, W., & Xiang, J. (2026). Physics-Guided Patch Distribution Modeling for Unsupervised Pin Defect Detection of Electrical Connectors. Sensors (14248220), 26(14), 4436. https://doi.org/10.3390/s26144436
Chicago Style (17th ed.) CitationWang, Gang, Shu Mao, Feiping Tang, Wei Hu, and Jiawei Xiang. "Physics-Guided Patch Distribution Modeling for Unsupervised Pin Defect Detection of Electrical Connectors." Sensors (14248220) 26, no. 14 (2026): 4436. https://doi.org/10.3390/s26144436.
MLA (9th ed.) CitationWang, Gang, et al. "Physics-Guided Patch Distribution Modeling for Unsupervised Pin Defect Detection of Electrical Connectors." Sensors (14248220), vol. 26, no. 14, 2026, p. 4436, https://doi.org/10.3390/s26144436.