王大虎, 张龙斐, 张鹏祥, & 常进超. (2026). 基于增强轻量化YOLO 的印刷电路板表面 缺陷检测方法. Science Technology & Engineering, 26(24), 10494. https://doi.org/10.12404/j.issn.1671-1815.2506647
Chicago Style (17th ed.) Citation王大虎, 张龙斐, 张鹏祥, and 常进超. "基于增强轻量化YOLO 的印刷电路板表面 缺陷检测方法." Science Technology & Engineering 26, no. 24 (2026): 10494. https://doi.org/10.12404/j.issn.1671-1815.2506647.
MLA (9th ed.) Citation王大虎, et al. "基于增强轻量化YOLO 的印刷电路板表面 缺陷检测方法." Science Technology & Engineering, vol. 26, no. 24, 2026, p. 10494, https://doi.org/10.12404/j.issn.1671-1815.2506647.
Warning: These citations may not always be 100% accurate.
