Perilli, E., Baruffaldi, F., Bisi, M. C., Cristofolini, L., & Cappello, A. (2006). A physical phantom for the calibration of three-dimensional X-ray microtomography examination. Journal of Microscopy, 222(2), 124. https://doi.org/10.1111/j.1365-2818.2006.01580.x
Chicago Style (17th ed.) CitationPerilli, E., F. Baruffaldi, M. C. Bisi, L. Cristofolini, and A. Cappello. "A Physical Phantom for the Calibration of Three-dimensional X-ray Microtomography Examination." Journal of Microscopy 222, no. 2 (2006): 124. https://doi.org/10.1111/j.1365-2818.2006.01580.x.
MLA (9th ed.) CitationPerilli, E., et al. "A Physical Phantom for the Calibration of Three-dimensional X-ray Microtomography Examination." Journal of Microscopy, vol. 222, no. 2, 2006, p. 124, https://doi.org/10.1111/j.1365-2818.2006.01580.x.