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Electrical characterization of He-ion implantation-induced deep levels in p...n InP junctions.

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Title: Electrical characterization of He-ion implantation-induced deep levels in p...n InP junctions.
Authors: Quintanilla, L., Pinacho, R.
Source: Journal of Applied Physics. 11/1/1999, Vol. 86 Issue 9, p4855. 6p. 5 Graphs.
Database: Academic Search Ultimate
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PubType: Academic Journal
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  Data: Electrical characterization of He-ion implantation-induced deep levels in p...n InP junctions.
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  Data: <searchLink fieldCode="AR" term="%22Quintanilla%2C+L%2E%22">Quintanilla, L.</searchLink><br /><searchLink fieldCode="AR" term="%22Pinacho%2C+R%2E%22">Pinacho, R.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>. 11/1/1999, Vol. 86 Issue 9, p4855. 6p. 5 Graphs.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=2472105
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        Value: 10.1063/1.371452
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 4855
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      – TitleFull: Electrical characterization of He-ion implantation-induced deep levels in p...n InP junctions.
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              Text: 11/1/1999
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              Y: 1999
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