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Manufacturing Tolerance Analysis, Fabrication, and Characterization of 3-D Submillimeter-Wave Electromagnetic-Bandgap Crystals.

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Title: Manufacturing Tolerance Analysis, Fabrication, and Characterization of 3-D Submillimeter-Wave Electromagnetic-Bandgap Crystals.
Authors: Martínez, Beatriz1, Ederra, Iñigo2, Gonzalo, Ramón2 ramon@unavarra.es, Alderman, Byron3, Azcona, Luis3, Huggard, Peter G.3, De Hon, Bas4, Hussain, Ali5, Andrews, Steve R.5, Marchand, Laurent6, De Maagt, Peter6 Peter.de.Maagt@esa.int
Source: IEEE Transactions on Microwave Theory & Techniques. Apr2007, Vol. 55 Issue 4, p672-681. 10p.
Database: Academic Search Ultimate
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  Data: Manufacturing Tolerance Analysis, Fabrication, and Characterization of 3-D Submillimeter-Wave Electromagnetic-Bandgap Crystals.
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Microwave+Theory+%26+Techniques%22">IEEE Transactions on Microwave Theory & Techniques</searchLink>. Apr2007, Vol. 55 Issue 4, p672-681. 10p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=24880429
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        Value: 10.1109/TMTT.2007.892803
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