Li, J. Z., Bai, J., Park, J., Adekore, B., Fox, K., Carroll, M., . . . Shellenbarger, Z. (2007). Defect reduction of GaAs epitaxy on Si (001) using selective aspect ratio trapping. Applied Physics Letters, 91(2), 021114. https://doi.org/10.1063/1.2756165
Chicago Style (17th ed.) CitationLi, J. Z., J. Bai, J.-S Park, B. Adekore, K. Fox, M. Carroll, A. Lochtefeld, and Z. Shellenbarger. "Defect Reduction of GaAs Epitaxy on Si (001) Using Selective Aspect Ratio Trapping." Applied Physics Letters 91, no. 2 (2007): 021114. https://doi.org/10.1063/1.2756165.
MLA (9th ed.) CitationLi, J. Z., et al. "Defect Reduction of GaAs Epitaxy on Si (001) Using Selective Aspect Ratio Trapping." Applied Physics Letters, vol. 91, no. 2, 2007, p. 021114, https://doi.org/10.1063/1.2756165.