SIM Comparison of DC Resistance Standards at 1 Ω,1 MΩ, and 1 GΩ.
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| Title: | SIM Comparison of DC Resistance Standards at 1 Ω,1 MΩ, and 1 GΩ. |
|---|---|
| Authors: | Jarrett, Dean G.1 dean.jarrett@nist.gov, Elmquist, R. E.1, Nien Fan Zhang1, Tonina, Alejandra2 atonina@inti.gov.ar, Porfiri, Marta2, Fernandes, Janice de Brito3 jbfernandes@inmetro.gov.br, Schechter, Helio3, Izquierdo, Daniel4 DIzquierdo@ute.com.uy, Faverio, Carlos4, Slomovitz, Daniel4, Inglis, Dave5 dave.inglis@nrc-cnrc.gc.ca, Wendler, Kai5, Marquez, Felipe Hernandez6 thernand@cenam.mx, Medina, Benjamín Rodríguez6 |
| Source: | IEEE Transactions on Instrumentation & Measurement. Apr2009, Vol. 58 Issue 4, p1188-1195. 8p. 7 Graphs. |
| Database: | Academic Search Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 37037362 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=37037362 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TIM.2008.2008582 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 1188 Titles: – TitleFull: SIM Comparison of DC Resistance Standards at 1 Ω,1 MΩ, and 1 GΩ. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jarrett, Dean G. – PersonEntity: Name: NameFull: Elmquist, R. E. – PersonEntity: Name: NameFull: Nien Fan Zhang – PersonEntity: Name: NameFull: Tonina, Alejandra – PersonEntity: Name: NameFull: Porfiri, Marta – PersonEntity: Name: NameFull: Fernandes, Janice de Brito – PersonEntity: Name: NameFull: Schechter, Helio – PersonEntity: Name: NameFull: Izquierdo, Daniel – PersonEntity: Name: NameFull: Faverio, Carlos – PersonEntity: Name: NameFull: Slomovitz, Daniel – PersonEntity: Name: NameFull: Inglis, Dave – PersonEntity: Name: NameFull: Wendler, Kai – PersonEntity: Name: NameFull: Marquez, Felipe Hernandez – PersonEntity: Name: NameFull: Medina, Benjamín Rodríguez IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2009 Type: published Y: 2009 Identifiers: – Type: issn-print Value: 00189456 Numbering: – Type: volume Value: 58 – Type: issue Value: 4 Titles: – TitleFull: IEEE Transactions on Instrumentation & Measurement Type: main |
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