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Evaluating the effects of temperature gradients and currents nonuniformity in on-chip interconnects

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Title: Evaluating the effects of temperature gradients and currents nonuniformity in on-chip interconnects
Authors: Spennagallo, N.1 spennagallo@elet.polimi.it, Codecasa, L.1 codecasa@elet.polimi.it, D’Amore, D.1 damore@elet.polimi.it, Maffezzoni, P. pmaffezz@elet.polimi.it
Source: Microelectronics Journal. Jul2009, Vol. 40 Issue 7, p1154-1159. 6p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 43312154
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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      – Type: doi
        Value: 10.1016/j.mejo.2008.02.023
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      – Code: eng
        Text: English
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              Text: Jul2009
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