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Evaluating the effects of temperature gradients and currents nonuniformity in on-chip interconnects

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Bibliographic Details
Title: Evaluating the effects of temperature gradients and currents nonuniformity in on-chip interconnects
Authors: Spennagallo, N.1 spennagallo@elet.polimi.it, Codecasa, L.1 codecasa@elet.polimi.it, D’Amore, D.1 damore@elet.polimi.it, Maffezzoni, P. pmaffezz@elet.polimi.it
Source: Microelectronics Journal. Jul2009, Vol. 40 Issue 7, p1154-1159. 6p.
Database: Academic Search Ultimate
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