APA (7th ed.) Citation

Kim, H., Choi, J., MacDonald, E., & Wicker, R. (2010). Slice overlap-detection algorithm for process planning in multiple-material stereolithography. International Journal of Advanced Manufacturing Technology, 46(9-12), 1161. https://doi.org/10.1007/s00170-009-2181-x

Chicago Style (17th ed.) Citation

Kim, Ho-Chan, Jae-Won Choi, Eric MacDonald, and Ryan Wicker. "Slice Overlap-detection Algorithm for Process Planning in Multiple-material Stereolithography." International Journal of Advanced Manufacturing Technology 46, no. 9-12 (2010): 1161. https://doi.org/10.1007/s00170-009-2181-x.

MLA (9th ed.) Citation

Kim, Ho-Chan, et al. "Slice Overlap-detection Algorithm for Process Planning in Multiple-material Stereolithography." International Journal of Advanced Manufacturing Technology, vol. 46, no. 9-12, 2010, p. 1161, https://doi.org/10.1007/s00170-009-2181-x.