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Slice overlap-detection algorithm for process planning in multiple-material stereolithography.

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Title: Slice overlap-detection algorithm for process planning in multiple-material stereolithography.
Authors: Ho-Chan Kim1 hckim@andong.ac.kr, Jae-Won Choi2,3, MacDonald, Eric2,4, Wicker, Ryan2,3
Source: International Journal of Advanced Manufacturing Technology. May2010, Vol. 46 Issue 9-12, p1161-1170. 10p. 1 Color Photograph, 18 Diagrams, 1 Chart.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 47885072
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Slice overlap-detection algorithm for process planning in multiple-material stereolithography.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Ho-Chan+Kim%22">Ho-Chan Kim</searchLink><relatesTo>1</relatesTo><i> hckim@andong.ac.kr</i><br /><searchLink fieldCode="AR" term="%22Jae-Won+Choi%22">Jae-Won Choi</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22MacDonald%2C+Eric%22">MacDonald, Eric</searchLink><relatesTo>2,4</relatesTo><br /><searchLink fieldCode="AR" term="%22Wicker%2C+Ryan%22">Wicker, Ryan</searchLink><relatesTo>2,3</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Advanced+Manufacturing+Technology%22">International Journal of Advanced Manufacturing Technology</searchLink>. May2010, Vol. 46 Issue 9-12, p1161-1170. 10p. 1 Color Photograph, 18 Diagrams, 1 Chart.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=47885072
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s00170-009-2181-x
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 1161
    Titles:
      – TitleFull: Slice overlap-detection algorithm for process planning in multiple-material stereolithography.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ho-Chan Kim
      – PersonEntity:
          Name:
            NameFull: Jae-Won Choi
      – PersonEntity:
          Name:
            NameFull: MacDonald, Eric
      – PersonEntity:
          Name:
            NameFull: Wicker, Ryan
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May2010
              Type: published
              Y: 2010
          Identifiers:
            – Type: issn-print
              Value: 02683768
          Numbering:
            – Type: volume
              Value: 46
            – Type: issue
              Value: 9-12
          Titles:
            – TitleFull: International Journal of Advanced Manufacturing Technology
              Type: main
ResultId 1