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Slice overlap-detection algorithm for process planning in multiple-material stereolithography.

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Bibliographic Details
Title: Slice overlap-detection algorithm for process planning in multiple-material stereolithography.
Authors: Ho-Chan Kim1 hckim@andong.ac.kr, Jae-Won Choi2,3, MacDonald, Eric2,4, Wicker, Ryan2,3
Source: International Journal of Advanced Manufacturing Technology. May2010, Vol. 46 Issue 9-12, p1161-1170. 10p. 1 Color Photograph, 18 Diagrams, 1 Chart.
Database: Academic Search Ultimate
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