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Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology.

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Bibliographic Details
Title: Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology.
Authors: Schlossmacher, P.1, Klenov, D.O.1, Freitag, B.1, von Harrach, H.S.1
Source: Microscopy Today. 2010, Vol. 18 Issue 4, p14-20. 7p.
Database: Academic Search Ultimate
Description
ISSN:15519295
DOI:10.1017/S1551929510000404